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ISSN - 00319007, EISSN - 10797114, Physical Review Letters, 2004, vol. 92, p. 241802-1

Study of B± → J/Ψπ± and B± → J/ΨK± decays: Measurement of the ratio of branching fractions and search for direct CP violation

Aubert B., Barate R., Boutigny D., Couderc F., Gaillard J. M., Hicheur A., Karyotakis Y., Lees J. P., Tisserand V., Zghiche A., Palano A., Pompili A., Chen J. C., Qi N. D., Rong G., Wang P., Zhu Y. S., Eigen G., Ofte I., Stugu B., Abrams G. S., Borgland AW, Breon A. B., Brown D. N., Button-Shafer J., Cahn R. N., Charles E., Day C. T., Gill M. S., Gritsan A. V., Groysman Y., Jacobsen R. G., Kadel R. W., Kadyk J., Kerth L. T., Kolomensky Yu G., Kukartsev G., LeClerc C., Levi M. E., Lynch G., Mir L. M., Oddone P. J., Orimoto T. J., Pripstein M., Roe N. A., Ronan M. T., Shelkov V. G., Telnov A. V., Wenzel W. A., Ford K., Harrison T. J., Hawkes C. M., Morgan S. E., Watson A. T., Watson N. K., Fritsch M., Goetzen K., Held T., Koch H., Lewandowski B., Pelizaeus M., Steinke M., Boyd J. T., Chevalier N., Cottingham W. N., Kelly M. P., Latham T. E., Wilson F. F., Abe K., Cuhadar-Donszelmann T., Hearty C., Mattison T. S., McKenna J. A., Thiessen D., Kyberd P., Teodorescu L., Blinov V. E., Bukin A. D., Druzhinin V. P., Golubev V. B., Ivanchenko V. N., Kravchenko E. A., Onuchin A. P., Serednyakov S. I., Skovpen Yu I., Solodov E. P., Yushkov A. N., Best D., Bruinsma M., Chao M., Eschrich I., Kirkby D., Lankford A. J., Mandelkern M., Mommsen R. K., Roethel W., Stoker D. P., Buchanan C., Hartfiel B. L., Gary J. W.

Decays that measure the ratio of branching fractions and searches for direct CP violations were analyzed. The decays were collected with the BABAR detector at the PEP-II asymmetric B factory at SLAC. The fitted asymmetries for the small observed differences in the tracking efficiency were corrected between positively and negatively charged track. It was found that the uncertainty in the fixed parameters of the PDFs, determined by fits to stimulated or nonsignal data sets, contributed 0.001 to the systematic errors.