ISSN - 00036951, EISSN - 10773118, Applied Physics Letters, 2015, vol. 107, 17, p. -
InAs-based metal-oxide-semiconductor structure formation in low-energy Townsend discharge
© 2015 AIP Publishing LLC. We developed and applied a method of InAs passivation in the low-energy plasma of Townsend discharge. The controlled interface oxidation in the Ar:O2:CF4 gas mixture under visualization of gas discharge plasma allowed growing thin homogeneous films in the range of 5-15 nm thickness. Oxidation with the addition of CF4 in gas-discharge plasma led to the formation of In and As oxyfluorides with a wide insulating gap and isostructural interface with unpinned Fermi level behavior. The metal-oxide-semiconductor structure showed excellent capacitance-voltage characteristics: small frequency dispersion (<15 mV), density of interface states (Dit) in the gap below 5 × 1010eV-1cm-2, and fixed charge (Qfix) below 5 × 1011cm-2.